Revised UI, increased performance in Keithley’s parameter analyzer

August 04, 2016 // By Graham Prophet
Under its Keithley brand, encompassing DC and precision low-level measurements, Tektronix has inroduced the 4200A-SCS Parameter Analyzer. Measurements such as those made on experimental silicon wafers may suffer accuracy and repeatability variations if correct probing and methodologies are not followed: hence, Tek has built a high level of users guidance and help-menus into the user interface of the analyzer.

Users will be able to reduce characterization complexity and get faster results relating to semiconductor devices, materials and processes, Tek adds: as well as the new user interface and embedded measurement expertise, the modular unit includes an updated IV/CV switch module. The built-in self-learning tools include expert instructional videos embedded into the instrument.

Most of the front panel of the analyzer’s mainframe is taken up with an LCD screen which both displays measurements and provides the video help. The result is up to 50% reduction in test setup times and significantly easier and more intuitive operation. Usability is particularly important for applications such as semiconductor device research, device failure analysis or reliability testing where instruments are a shared resource among multiple users.

"Parameter analysis is critical to characterizing new semiconductor devices, materials or testing the reliability of devices before commercial use. However, researchers may only need to perform these tests sporadically, making it hard for them to become experts at using parametric testing instrumentation," said Mike Flaherty, general manager, Keithley product line at Tektronix. "That's why we went to great lengths to make the 4200A-SCS exceptionally easy to set up and easy to learn how to operate even for users with no prior experience with a parameter analyzer."

Tektronix is also introducing the Keithley 4200A-CVIV four channel IV/CV switch module. This module for use with the 4200A-SCS mainframe provides on-the-fly switching between SMU [source-measure unit] current-voltage (I-V) and capacitance-voltage (C-V) measurements, allowing users to move C-V measurements to any device terminal without lifting prober needles or moving cables.