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300MHz 32×8 PXIe modules boost RF switching density

300MHz 32×8 PXIe modules boost RF switching density

New Products |
By Nick Flaherty



Pickering Interfaces has launched integrated 300MHz PXI RF matrix modules with a 32×8 topology to increase the matrix density per chassis slot by a third.

The compact-footprint 40-724 PXI & 42-724 PXIe modules use ruthenium reed relays to provide a usable bandwidth of 300 MHz for non-loop-thru models.

The modules have options with loop-thru ports on the Y-axis for larger applications requiring matrix expansion. To provide the maximum granularity of test system construction, the 4x-724 family is available in four matrix sizes: 16×4, 16×8, 32×4 and the fully populated 32×8, each with loop-thru options.

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The loop-thru ports are connected directly to the matrix, which allows the creation of X-to-X signal paths between cards when cascading multiple modules. This helps increase test system flexibility but with reduced RF performance.

“The family builds on existing Pickering RF matrix module technology to increase the maximum matrix size to 32×8 for use in 50Ω test applications. The increased density, representing a marked increase over existing products, allows complex switching systems to be produced while requiring only two chassis slots,” said Steve Edwards, Switching Product Manager at Pickering Interfaces.

The 4x-724 RF matrix modules use ruthenium-sputtered reed relays, ensuring a long service life. Also, reed relays have a typical operating time of 0.5 ms, significantly shorter than electromechanical-based solutions. This can minimize the test cycle duration and increasing product test throughput.

The modules are available with a PXI or PXIe control interface providing flexibility in chassis selection. All versions use industry-standard SMB connectors to maximize system performance while simplifying the interface to external instrumentation and DUTs.

The new 4x-724 RF matrix modules are aimed at general-purpose RF testing in many applications, including emergency radios and semiconductor test. All versions of the 4x-724 are supported by Pickering’s eBIRST switching system test tools that can be used for preventative maintenance tests to determine if relays are approaching end-of-life. In addition, the eBIRST tools allow fast fault finding, thus minimizing system downtime. Pickering’s connection division offers both standard and custom cable solutions that can aid with the integration of the module into the test system.

www.pickeringtest.com

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