65 GHz full 12bit oscilloscope for debug and test

65 GHz full 12bit oscilloscope for debug and test

New Products |
By Nick Flaherty

Teledyne LeCroy has launched a 65GHz oscilloscope with 12bit resolution across the whole range and 8Gpoints of acquisition memory.

The WaveMaster 8000HD platform has models from 20 to 65 GHz of bandwidth, 12 bits of resolution, up to 320 GS/s of sample rate and the 8Gpts of acquisition memory. It also adds new SDA Expert serial data analysis software options for testing next-generation PAM4 serial data technologies.

The oscilloscope is aimed at test and debug but also for compliance and production testing.

Serial data technologies are increasing in speed with PCI Express 6.0 running at 64 gigatransfer per second (GT/s) data rate and USB4 running 80Gbit/s, driving the need for higher bandwidth scopes. Both use multi-level pulse-amplitude-modulation (PAM) signals (PAM3 and PAM4) which also need consistent resolution to look at the dynamic link equalization, negotiation, training and handshaking operations to establish and maintain the highest transfer rates. Some of these operations are performed over parallel low-speed serial data links using a combination of physical layer signals and protocol communications.

The WaveMaster 8000HD series is aimed at these PCIe 6.0 and USB4 Specification v2.0 applications, doubling the bandwidth and sample rate of its predecessor with four times more resolution and acquisition memory of other systems.

The scope can merge the functions with a Teledyne LeCroy PCIe or USB protocol analyzer using CrossSync PHY cross-layer analysis to provide unique insight into high-speed link behaviors.

It can capture low-speed serial data sideband, training and negotiation links, power rails, and other associated signals using nearly every 50 Ω or 1 MΩ coupled probe including passive probes and current probes.

There are over 20 low-speed serial triggers and decoders that can be used for both low-speed and high-speed debug on the same oscilloscope, and digital signals can be captured with digital logic (mixed-signal) inputs up to 500 MHz clock rate. The HDA125 High-speed Digital Analyzer option supports digitally acquired signals up to 6 Gb/s for DDR memory signal acquisition, decoding and read/write separation as part of DDR debug and compliance testing.

The SDA Expert software options provide simplified expertise with tailored technology analysis for PCIe, USB, DisplayPort and more, as well as containing powerful PAM and non-return-to-zero (NRZ) eye diagram, jitter and link analysis tools. QualiPHY test packages provide simple compliance test automation for complex high-speed serial data interfaces. All these serial data test capabilities are especially useful for next-generation PCIe 6.0, USB4, USB4 Specification v2.0 and DisplayPort® over USB-C.

“Artificial intelligence (AI), high performance computing, and ubiquitous computing are driving the unprecedented growth of industry I/O requirements, enabled by serial data links with increased signaling speed and complexity, such as PCI Express 6.0 and USB4 Specification v2.0”, said Jim Pappas, Director of Technology Initiatives at Intel.  “Solutions like those from Teledyne LeCroy are vital to the ecosystems that fuel the rapid innovations occurring in these markets.”

“Teledyne LeCroy high-bandwidth oscilloscopes and compliance tools have been critical to our product development process for testing our next-generation serial interfaces,” said Vivek Khanzode, Vice President, Systems Engineering at Marvell. “The ability to link the scopes to our Teledyne LeCroy protocol analyzers is invaluable for fast root-cause analysis of interoperability problems, increasing confidence and significantly reducing our time to market.”;

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