8GHz phase noise analyser for radio system test
Rohde & Schwarz has developed a new phase noise analyser and VCO test system for production and design engineers who characterize sources such as synthesizers, VCOs, OCXOs, and DROs.
All radio or RF based devices, including radar, communications satellites and mobile phones require the purest signal generation and reception electronics. Without them, the push for ever higher radar resolution or data rate increases for 5G and beyond would be impossible.
The FSPN comes in two models: one covers the frequency range from 1 MHz to 8 GHz and the other from1 MHz to 26.5 GHz, both with phase noise of under –163 dBc (1 Hz) (f = 1 GHz, 10 kHz offset). These are aimed at radar and satellite applications in the C band, X band, Ku band, and the complete K band.
- Rohde & Schwarz, IHP team for 6G test
- Measuring power supply noise rejection in oscillators
- Eurofins, R&S team on high speed standard compliance testing
- Test system for 5G and WiFi6
This expands the Rohde & Schwarz phase noise product portfolio with the FSWP phase noise, spectrum and signal analyzer. The R&S FSPN shares established R&S FSWP features such as low noise internal local oscillators coupled with real-time cross correlation engines for increased measurement sensitivity.
Cross-correlation sensitivity gains can be viewed in real-time in result traces, allowing users to adjust the trade-off between measurement speed and sensitivity to meet their application requirements. Users in production need just a few correlations to measure high-quality oscillators, synthesizers or VCOs with high throughput.
Increasing the number of correlations allows characterisation of the most sensitive commercially available synthesizers and oscillators. Simultaneous device frequency and phase settling times can be measured with up to 8 GHz of real-time analysis bandwidth. To investigate oscillator long-term frequency stability, the FSPN calculates the Allan variance in the time domain at fixed intervals and uses phase noise measurements to apply cross-correlations and suppress spurs.
The FSPN is also equipped with three ultra-low-noise DC sources to supply and sweep VCOs. The built-in VCO characterization measurement mode analyzes VCO characteristics such as frequency, sensitivity, RF power or current draw versus tuning voltage. For a more in-depth view of the device under test, the spot-noise versus tune measurement mode combines a sweep with ultra-low-noise DC sources plus fast and accurate phase noise measurements. VCO harmonics can also be measured versus tuning voltage without an additional spectrum analyzer.
Since Rohde & Schwarz designed the R&S FSPN as a pure phase noise analyzer, all relevant measurement modes and enhancements come standard. Users only need to choose the frequency range to order.
The FSPN phase noise analyzer and VCO tester is available now.
Other articles on eeNews Europe
- Globalfoundries files for $20bn IPO as it rejects Intel option
- $2bn boost for 300mm silicon wafer supply
- Modular electronics for 20 qubit Swedish quantum computer
- Taiwan taps Oxford Instruments to expand compound semiconductor supply chain
- First industrial programmable I/O module with Raspberry Pi micro
- Farewell Cree as it transitions to Wolfspeed
- Intel launches second generation neuromorphic chip on 4nm