Accelerator cuts DPD loop times for power amplifier testing
Using the M9451A, engineers can make closed/open loop DPD and envelope tracking measurements in tens of milliseconds for up to a 100 times speed improvement.
The M9451A is now integrated with the RF PA/FEM Characterization and Test, Reference Solution, to provide even higher throughput while maintaining highly accurate S-parameter, harmonic distortion, power and demodulation measurements. The Reference Solution enables full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD).
The robust DPD algorithms in the Reference Solution came from years of close cooperation with wireless manufacturing customers and insights gained from Keysight’s SystemVue simulation and N7614B Signal Studio for Power Amplifier Test software applications. The software is claimed to make it the only solution capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.
The Reference Solution’s open source test scripting example code facilitates rapid evaluation of power amplifier test configurations and reduces time to first measurement. With this new capability, engineers can improve device performance with DPD and ET while also reducing test time.
PADs are a popular alternative to more traditional power amplifier architecture because along with lower power consumption and greater efficiency and value, they allow device designers to save and optimize space by replacing multiple, discrete components with a single, compact module. PADs are also gaining in popularity with device designers because of the trend toward increasing band counts due to the implementation of LTE networks.
If you enjoyed this article, you will like the following ones: don't miss them by subscribing to :
