Advantest releases fastest fully integrated memory test card
The card launch makes Advantest the first automatic test equipment (ATE) supplier to provide an integrated test solution that supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16 Gbps.
The HSM16G card delivers a complete range of memory test capabilities, including per-pin algorithmic pattern generation to test any kind of fault algorithm, and provides fail bitmap capture. A precision per-pin clock with less than 1 picosecond jitter enables the industry’s most accurate jitter measurements. Along with per-pin-based arbitrary jitter modulation for device characterization and stress test as well as a set of integrated analysis tools, the card provides a comprehensive measurement suite for thorough device characterization. Programmable equalization allows for cable loss compensation and rise time control to support the best signal integrity in both engineering and production. Per-pin embedded searches for rapid alignment to the center of the data eye, fast eye measurements to screen for both eye height and eye width, and an integrated time measurement unit (TMU) for jitter measurements provide a set of key volume-production features.
For memory ICs with serial bus interfaces such as PCI Express (PCIe) and Universal Flash Storage (UFS), the HSM16G card offers the comprehensive capability for physical layer test (PHY characterization). This enables the card to cover all memory devices with high-speed serial interfaces or high-speed parallel memory buses.
Fully compatible with the V93000 HSM series’ hardware and software, the HSM16G card can be factory installed or retrofit onto a customer’s existing base of installed testers. The card provides a seamless extendibility by allowing all existing test programs for HSM testers to be re-used with minimal adaption effort. This requires only a small evolutionary increment for users’ application knowledge, but provides a doubling in high-speed testing for DRAM devices.
The card’s 16-Gbps operating speed is faster than any other system on the market. To test today’s fastest ICs, other testers must compensate by performing complex multiplexing using two 10-Gbps channels with add-on solutions to reach the higher speeds needed. Because of the subsequent multiplexing, APG pattern generation is restricted and only a limited feature set is available for characterization and debugging. The HSM16G’s native 16-Gbps speed allows it to avoid these constraints. When equipped with the fully integrated HSM16G card, the V93000 platform offers the broadest capabilities available in the high-speed memory test market.
Shipments of HSM16G evaluation units have begun and the first customer orders are in process.
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