Agilent and Cascade combine forces on wafer-level measurements
Specifying and configuring a wafer-level RF measurement system can be challenging and time-consuming, often requiring equipment to be sourced from multiple suppliers and then configured and verified on-site by the customer. As a result, the time to first measurement can be long, a time frame often measured in months. With wafer-level measurement solutions (WMS) from Agilent and Cascade Microtech, semiconductor customers now have the equipment they need to perform accurate and repeatable DC and RF measurements, device characterization and modeling, all while realizing significant time savings to first measurement.
“Agilent and Cascade Microtech are the worldwide leaders in test and measurement and on-wafer probing, offering both the expertise and products to provide all the building blocks for wafer-level device testing,” said Gregg Peters, vice president and general manager of Agilent’s Component Test Division.
“Semiconductor process development, modeling and characterization tasks are evolving, time-to-market cycles are shrinking, and the need for greater accuracy is increasing,” said Michael Burger, president and chief executive officer of Cascade Microtech. “By working with Agilent to provide guaranteed wafer-level measurement solutions, we can now provide semiconductor engineers the tools they need to perform accurate and fast advanced DC and RF measurements on both components and devices to get their products to market on time.”
The latest wafer-level measurement systems combine Cascade Microtech’s wafer probe stations, probes and calibration tools with Agilent’s test instrumentation and measurement and analysis software. Each system configuration is pre-validated to ensure it meets customers’ specific application needs, then validated again—based on previously agreed-upon acceptance criteria—after installation by Cascade Microtech experts. Guaranteed configuration means that any parts missing from the configured system will be provided by either Agilent or Cascade Microtech, free of charge.
Agilent and Cascade Microtech have also collaborated to deliver unique workflow software based on Agilent’s WaferPro-XP measurement software. Together with Cascade Microtech’s Velox probe station software, customers can now develop complete wafer test suites for a variety of measurement needs (e.g., S-parameters, DC-IV/CV, noise figure, flicker noise, and gain compression). This combination of software provides a coherent environment for test development.
Each wafer-level measurement solution is backed by the offer of a full support package, with access to regional experts who are highly skilled in on-wafer test and measurement. Cascade Microtech acts as the single point of contact to ensure quick problem resolution.
Agilent and Cascade Microtech wafer-level RF measurement systems are now available in a range of configurations, from a fully integrated new solution with either a semi-automated or manual prober, to application-specific hardware upgrades to existing probe stations. The WaferPro-XP measurement software platform for R&D device characterization can also be added to an existing wafer-level measurement system.
www.cascademicrotech.com
www.agilent.com
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