Analysis software speeds up semiconductor yield, product and test engineering

New Products |
By eeNews Europe

Currently engineers need to compile test data from multiple sources and then add their own analysis, a process than can take hours or even days. By using Silicondash the analysis and reporting processes are to a large extent automated and can be completed in minutes. Very detailed statistical root cause analysis, as well as high-level aggregated summary reports are accessible in just a couple of clicks.

Designed to handle all types of test data regardless of product type, data source or volume, Silicondash provides a real-time, detailed overview of the entire manufactured volume, making it extremely easy to identify, analyse and act on quality or yield issues in manufacturing and test processes.

Implemented as a cloud-hosted service, Silicondash does not require software to be installed locally and allows engineers in multiple locations to securely access and share data in real-time, providing full transparency in the semiconductor manufacturing and test processes.

Designed for jobs of all sizes from just a few wafers up to analysing test data for high volume chip manufacturing, the tool generates daily, weekly or quarterly overview reports, updated on a real time basis, providing easy drill-down features and custom feedback alerts set up for early problem detection.

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