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Automotive Hall-effect ICs feature integrated self-test

Automotive Hall-effect ICs feature integrated self-test

By eeNews Europe



The APS11450 is a family of unipolar switch ICs, while the APS12450 devices are bipolar latches. The devices are pin-compatible upgrades for existing three-wire Hall switch and latch ICs developed in accordance with ISO 26262:2011 with ASIL-B capability (pending assessment).

The magnetic sensors have always active integrated self-test features, leading to very short fault detection times. Tests are typically executed in 25µs to appear transparent to host system. The voltage-mode output communicates the sensor’s status, while remaining backward compatible with logic-level interfaces, application circuits, wiring, and firmware.

APS11450 and APS12450 were designed to enhance the performance of a variety of automotive applications and intelligent motion systems and are ideal for use in ADAS systems and encoders for window lifts, seat motors, seatbelt tensioners, and closure systems.

The APS11450/12450 are qualified beyond the requirements of AEC-Q100 grade 0. They were developed to ISO 26262 as a hardware safety element out of context with ASIL-B capability (pending assessment). The integrated safety features are also beneficial to other safety systems. Using the APS11450/12450 devices, an ASIL-B (or higher) rating can be achieved without redundant sensors.

The devices are offered in two packages, with magnetic characteristics that match legacy Hall sensors, making them highly flexible and easy to design with. These monolithic ICs can operate from 3.3 to 24 V and at up to 175°C junction temperature, surviving up to +35 V inputs, reverse-battery (-30V), output shorts, load-dump, and other over-voltage transients. Allegro’s miniature LH package is a SOT-23W style package for surface-mount applications; the UA is a 3-pin, single inline package (SIP) for through-hole mounting. Both packages are lead (Pb) free, with 100% matt-tin leadframe plating.

More information

www.allegromicro.com

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