Boundary Scan I/O module now supports process voltages up to 30V
Additionally, the new module offers the company’s VarioCore technology for dynamic configuration of module-specific FPGA based functions. Using the SFX5212 provides users the opportunity to increase test coverage for non-Boundary Scan circuits or peripheral signals with higher signal voltage by combining structural and functional test procedures on a single platform. In addition to increasing test quality, test costs can be reduced by saving separate process steps. The SFX5212 provides 12 channels with a driver performance of up to 150mA, independently programmable as input, output or tri-state. The I/O voltage may be programmed onboard or externally supplied.
The module is controlled TAP independent via the Scanflex internal, parallel bus. If more channels are needed, several modules may be cascaded with no problem. While the module acts statically in the Boundary Scan mode, supporting all procedures such as interconnection test or cluster test, the functional mode provides opportunities like protocol generator, data recorder or counter/timer, to name just a few.
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