Chamber-based solid state drive tester for automotive thermal standards

Chamber-based solid state drive tester for automotive thermal standards

New Products |
By Nick Flaherty

The fully integrated MPT3000ARC SSD test system can operate over a broad temperature range to test all SSDs used in rapidly multipling applications, including connected devices from smart cars to wearable electronics.

Increasing volumes of SSDs are being used in rugged thermal environments. These devices must be proven to withstand harsh conditions. The newest system in the MPT3000 series enables extended thermal testing by meeting automotive and industrial thermal test standards while applying the same proven architecture, software and performance – including PCIe Gen 4 support – already in wide use by SSD manufacturers.

The MPT3000ARC can accommodate a wide range of SSD form factors, from 40-mm M.2 memories to larger EDSFF devices, through changeable and customizable interface boards. Changing interface boards is quick and easy, enabling rapid changeover to support a wide variety of SSD test plans on a single system.

The system features the same tester-per-DUT architecture and hardware acceleration as all MPT3000 products for enhanced efficiency and performance. Adding the extended range thermal chamber creates a solution that targets reliability demonstration test (RDT) and, with production-compatible ergonomics and automation-friendly chamber access, also addresses volume-production SSD test requirements.

The system uses the same site modules and power supplies in each tester across the MPT3000ES2 engineering system, the MPT3000EV2 for RDT and the MPT3000HVM2 for high-volume production testing. These systems cover SSD test from design to manufacturing, providing SSD suppliers with the fastest, lowest risk path to market for their next-generation storage devices, including PCIe Gen 4 devices.

The MPT3000ARC system is available to customers now.

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