Chip tester handles high pin count display driver devices

New Products |
By eeNews Europe

The high integration of advanced DDIs confronts testers with a number or specific challenges: Since the touch-sensor functions of the LCDs are integrated into the DDI, the number of logic and analogue circuits to test is rather high. It is also expected that in the future power management functions will be integrated into the DDI. Additionally, the growing use of LCD panels in mobile applications including smart phones, tablet computers and notebook PCs is driving market demand for smaller device sizes and more capabilities.

The T6391 is the only test platform capable of handling all these test requirements. Being a member of Advantest’s well-established T6300, the tester leverages the same engineering environment model as the existing base of installed testers in the T6300 series. It uses the same TDL programming language while improving throughput by achieving faster data transfer and calculation.

The tester is equipped with a speed bus that enables high testing throughput. With 512 I/O channels, the T6391 can test multiple chips simultaneously. It can accommodate high-resolution DDIs with up to 3,584 LCD pins – enough to test today’s highest pin count LCDs including full high-definition (HD), WXGA and HD720 displays.

The T6391 can handle I/O pin frequencies up to 1.6 gigabits per second (Gbps), allowing it to test DDIs that use MIPI (mobile industry process interface), the standard protocol for mobile electronics. An additional measurement module allows the system to test even faster interfaces up to 6.5 Gbps, which will be used in the LCD drivers for the next generation of ultra-high-definition televisions including the 4K (2160p) generation.

A 16-channel arbitrary waveform generator (AWG) and a digital capture feature provide the ability to test analog ICs. Scan and memory tests of touch-sensor-enabled DDIs can be conducted using the system’s scan pattern generator (SCPG), algorithmic pattern generator (ALPG) and address fail memory (AFM) module.

More information is available at

Related articles:

Advantest taps the cloud for electronics testing


Linked Articles
eeNews Europe