Chip testers meet at VOICE 2015 – Call for Papers

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By eeNews Europe

VOICE 2015 will take place on May 12 and 13, 2015. An additional "workshop" day in Advantest’s San José facilities will offer the opportunity to gain hands-on practice. The supplementary event in Shanghai will follow on May 22.

For both events, Advantest now has issued the Call for Papers. To ensure practical relevance, the selection committee includes many Advantest customers, in many cases developers who have daily contact to Advantest systems. The event is directed to test experts from IDMs, foundries, fables semiconductor companies, and OSATs (Outsource Assembly and Test).

At the conference, specific test challenges and new methodologies are discussed. VOICE 2015 will focus on seven technology areas:

  • Device Specific Testing: Techniques for testing MCUs, ASICs, PMICs, automotive radar, sensors, memory, baseband, cellular, multi-chip packages
  • Hardware Design and Integration: Tester/handler integration, probe and package loadboard design, challenges of new package technologies and fine pitch devices
  • Improving Throughput: Test time reduction, increased multi-site, multi-site efficiency, concurrent test
  • Reducing Time-to-Market: DFT, pattern simulations/cyclization, automatic test program generation, system-level test
  • New HW/SW Test Solutions: Solutions utilizing the latest hardware or software features
  • Test Methodologies: Techniques for testing DC, RF, mixed signal or high speed digital devices
  • Hot Topics: Timely topics covering test program quality control, security and encryption, production outsourcing, emerging wireless standards, test challenges at sub-28nm nodes or other subject matters trending in the ATE industry

Test developers can submit abstracts of their planes presentation to either of both locations. Submissions must be filed by November 21.

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