Contactor enables RF final testing at high temperatures

Contactor enables RF final testing at high temperatures

New Products |
By Wisse Hettinga

The closed-loop Intelligent Contactor Option on the cDragon controls the required conditions for the device under test (DUT). cDragon’s compatibility with existing setups allows for fast and easy conversion.

The temperature performance is achieved by a unique design integrating per pin heat exchangers and applying a closed-loop for temperature control to stabilize the temperature at the DUT. Low contact resistance with 22 GHz operation means the system is aimed at contacting advanced analogue and RF technology in DFN, QFN, QFP and SO packages.

The design of the cDragon pin ensures high test yield due to precise pointing accuracy and highly repeatable test results. Motion decoupling tabs hold the returning pin in a fixed free height position while the force-controlled wipe ensures reliable contact avoiding objectionable impacts on DUT pads and pin. Applying a non-destructive preload the design eliminates pad wear on the test interface board. The cDragon design features a self-cleaning reverse wipe action for extended cleaning intervals and longer pin life resulting in significantly higher uptime of the test cell.

“Working closely with our customers we see the need for test at increased device temperature ratings and speed in combination with a lower more stable contact resistance,” said Bert Brost, Product Manager at Cohu. “Traditional contactors and pin design are not able to meet this. The cDragon is a means for making precision electrical contact with the device under test at the specified test temperature. Its low contact resistance makes it the right contactor for testing devices with lower switching voltages and lower operating current due to the low IR drop across the cDragon contact pin. With the cDragon we provide a new standard for high temperature contacting.”

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