Cost-efficient testing of RF components
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By
eeNews Europe
The E5063A offers a trace noise of 0.002 dBrms and a stability of 0.01 dB/degC. This feature helps reduce test cost without sacrificing quality.
Using the network analyser with Agilent’s U1810B USB RF switch, engineers can build an economical multi-DUT test solution for testing four antennas with a single instrument, further reducing cost of test.
The combination of the E5063A and the 85070E dielectric probe kit offers an economical solution for characterizing dielectric material, making it suitable for material researchers with limited budgets, the vendor advertises.
For more information visit www.agilent.com/find/e5063a
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