DDR4 memory tester increases productivity

DDR4 memory tester increases productivity

New Products |
By eeNews Europe

The new T5503HS reaches test data rates of up to 4.5 Gbps which should be enough to handle the maximum operating frequencies of today’s most advanced double-data rate SDRAM memory chips, specified for 4,266 Gbps. The T5503HS also generates CRC codes and parity checks, simplifying the creation of test programs and reducing the customer’s workload.

For fast and economical production testing, the platform handles up to 512 memory chips in parallel. Installed T5593 testers can be upgraded on site, which gives users the option to extend the usage of their installed base. In addition, a real-time, source-synchronous function increases yield and throughput. With its speed edge over software-based solutions, a built-in hardware-based timing-training function further increases the throughput . Functions such as individual level settings, I/O dead-band cancelling and data bus inversion increase the product’s versatility and enable users to perform tests on most high-speed memories.

For more information visit

Read also

JEDEC reveals key attributes of upcoming DDR4 standard

Advantest taps the cloud for electronics testing

If you enjoyed this article, you will like the following ones: don't miss them by subscribing to :    eeNews on Google News


Linked Articles