Digital stimulus/response module targets RF chipset test systems

Digital stimulus/response module targets RF chipset test systems

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By eeNews Europe

A powerful pattern cyclizer technology enables on-the-fly pattern creation for single site, or up to four independent multi-sites, with high-voltage channels and open drain pins for simultaneous device test. This saves the engineer valuable time during design validation and production test.

Features of the M9195A PXIe module include the emulation of serial and parallel digital device interfaces, a precise vector time combining waveform tables and up to 250 ns stimulus/response delay compensation with 25 ps programming resolution, a 1ns-per-bit edge placement resolution giving engineers the ability to validate device design with greater accuracy.

The unit supports digital instrument control and pattern generation/editing through a soft front panel, comes with full-featured drivers and IEEE-1450 STIL programming standard or Open XML (Excel), and test development software to speed waveform pattern creation (patterns can also be imported from automated test applications).

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