Dual wavelength VNA simplifies characterization of optoelectronic devices

Dual wavelength VNA simplifies characterization of optoelectronic devices

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By eeNews Europe

With  the options, the MN4765B can be used with the MS4640B VectorStar Vector Network Analyzer (VNA) family to perform optoelectronic measurements up to 70 GHz at both 1310 nm and 1550 nm wavelengths.

Option 71 allows the MN4765B to be used with the VectorStar VNA to conduct optoelectronic measurements from 70 kHz to 70 GHz in the 1310 nm range, while Option 72 provides measurements from 70 kHz to 70 GHz at both 1310 nm and 1550 nm to be made. Both options use a NIST-characterized photodiode as the primary standard, for greater E/O and O/E measurement accuracy when compared to alternative methods.

The MN4765B module, combined with the MS4640B VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currently used. The MN4765B optical modules are designed with an InGaAs photodiode that converts modulated optical signals to electrical signals. The photodiode has exceptional bandwidth response to 70 GHz. Additional circuitry for temperature and bias stability are also incorporated into the modules.

With the new wavelength options, the MN4765B O/E calibration module can be used to conduct dual wavelength optoelectronic measurements to characterize components during R&D and manufacturing. It is also well suited for universities and research labs where modulation rates up to 70 GHz at dual wavelengths are being explored.

Vector Star VNAs provide more accurate measurements over single-sweep frequency ranges of 70 kHz to 20 GHz, 40 GHz, 50 GHz, 70 GHz, 110 GHz, 145 GHz and a variety of discrete bands to 1.1 THz. Unlike other VNA solutions on the market, the VectorStar family is built on a stable, modern platform that can be easily upgraded across a range of functionality and performance. The MS4640B VNA series offers a high level of performance, so device modeling engineers can accurately and reliably characterize their devices. R&D engineers can achieve the last fraction of a dB out of their state-of-the-art designs and manufacturing engineers can maximize throughput without sacrificing accuracy.

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