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Evaluation kit for event-driven vision with latest sensor

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By Nick Flaherty


Prophesee in Paris has launched an evaluation kit (EVK) to provide machine vision system developers with full performance evaluation of its event-driven vision sensor.

“This is a critical milestone in our joint development with Sony Semiconductor Solutions as we commercialize this Evaluation Kit featuring the event-based vision sensor technology achieved through our collaboration,” said Luca Verre, Prophesee founder and CEO. “This new EVK will enable system developers in areas such as industrial automation, IoT and manufacturing to get a complete and accurate understanding of how to leverage the performance advantages offered by this innovative architecture, and be ready to deploy machine vision solutions.”

The kit gives developers early access to the event-driven sensor, co-developed with Sony Semiconductor Solutions to have a 4.86μm pixel pitch and 1280 x720 pixel resolution. This kit supports full sensor bandwidth of up to 3Gbps via a USB 3 interface. The EVK enables comprehensive sensor control including digital pipeline (event signal processor – ESP) and features a C/CS with S-mount adapter.

As event-driven systems are different from current neural network machine learning AI frameworks, the EVK is fully compatible with the Metavision Intelligence Suite version 2.2. This allows developers to explore different event-driven approaches with customised software application to meet specific market requirements.

The EVK is available from Prophesee immediately.

www.prophesee.ai

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