Fast Z-axis piezo-scanner for inverted microscopes offers a 160×110mm clear aperture

Fast Z-axis piezo-scanner for inverted microscopes offers a 160×110mm clear aperture

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The latest version of the P-736 Z-axis piezo-scanner from Physik Instrumente can position well plates and sample holders for object slides and petri dishes on the optical axis with nanometer precision, with a travel range of 200 µm.
By eeNews Europe

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The P-736 has a large clear aperture of 160x110mm, high positional stability, and rapid settling times. Its small overall height of 20 mm allows it to be integrated easily into any standard inverted microscope.

The drive technology in the piezo scanner is based on PICMA piezo actuators with all-ceramic insulation. These are proven to be longer-lasting and less vulnerable to moisture than actuators with conventional polymer insulation, making the overall system outstandingly reliable.

For high-resolution position control, the new version of the P-736 is available with either cost-effective piezoresistive sensors, or capacitive sensors that provide for highest stability.

The piezo scanner is delivered as a complete system with a digital controller. The digital technology improves linearity and allows the flexible adjustment of the servo-control parameters. The controller has USB, RS-232 and analogue interfaces and can therefore be easily integrated into different control systems. It is additionally compatible with µManager, MetaMorph and Andor iQ.

Visit Physik Instrumente at www.physikinstrumente.com

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