Faster, lower noise, more versatile: Teledyne LeCroy bolsters high-end
The LabMaster 10 Zi-A delivers improved performance in effective number of bits and baseline noise along with an industry leading jitter measurement floor. The new WaveMaster 8 Zi-B features increased sample rate, lower noise, and the latest version of Teledyne LeCroy’s advanced oscilloscope user interface, MAUI.
The LabMaster 10 Zi-A series of real-time oscilloscopes builds on the success of the LabMaster 10 Zi oscilloscope series. The new models include significant improvements in signal fidelity and noise performance. With these enhancements, Teledyne LeCroy claims industry leadership in jitter measurement floor, while maintaining a spectacular 100 GHz bandwidth and a sample rate of 240 GHz. At the same time, the intrinsic (sample clock) jitter of just 50 fs is record-breaking. The LabMaster 10 Zi-A’s modular ChannelSync architecture lets users build oscilloscopes with up to 80 channels, with better than 130 fs channel-to-channel jitter. According to Teledyne LeCroy, no other oscilloscope can specify this level of performance. Serial data and optical modulation measurement toolkits, including SDAIII-CompleteLinQ and Optical-LinQ provide an adequate set of tools for advanced analysis. A new PAM4 analysis package is the first software package available for real-time oscilloscope analysis of systems using PAM4 signaling. These analysis capabilities coupled with the performance enhancements characterise the LabMaster 10 Zi-A as the tool of choice for for engineers designing next-generation high-speed electrical and optical links.
The WaveMaster 8 Zi-A has established itself as a workhorse oscilloscope platform for demanding measurement challenges in high-speed electronics, optical communications, and scientific research. The updated WaveMaster 8 Zi-B enhances the capabilities of its predecessor with lower noise, higher sampling rates, deeper acquisition memory, and the next generation of Teledyne LeCroy’s MAUI oscilloscope user interface. SDA 8 Zi-B Serial Data Analyzer models are specifically configured for testing today’s high-speed electronics systems, with an advanced eye and jitter analysis toolkit, additional acquisition memory, and a hardware serial data trigger. The SDA 8Zi-B is targeting demanding tasks in testing, characterizing and debugging USB3.1, PCI Express, DDR memory, MIPI M-PHY and D-PHY, and many other applications.
More information: www.teledynelecroy.com
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