First event-driven SWIR and optical sensor
SCD in Israel has developed the first short wavelength IR (SWIR) detector that integrates event-based IR and optical imaging.
The SWIFT-EI sensor integrates a Readout integrated circuit (R OIC) that provides two parallel video channels in one sensor – a standard imaging SWIR video channel, and a very high frame event imaging channel up to 1500 frame/s.
The InGaAs detector has a resolution of 640×512 with 10μm pixels and is produced at the company’s fab in Israel and is aimed at defence and industrial applications. Production is aimed for 2024.
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The event-based imaging channel provides advanced capabilities for defence applications such as such as laser event spot detections, multi-laser spot asynchronous laser pulse detection (ALPD) capabilities, while the SWIR event-based imaging broadens the scope of target detection and classification.
We are putting a lot of focus on economics of scale to improve capacity and yield,” said Shai Fishbeing, VP Business Development & Marketing at SCD. “We have the world’s largest fab for thermal imagers.”
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