First prototype of DRAM test board
Neumonda Technology in Germany has completed the first prototype of a new DRAM memory test board.
Qualification and testing of semiconductor components is one of the most expensive and complicated parts in the manufacturing of memory chips. Due to the size, complexity and costs of the equipment, only few companies can afford to implement test capabilities. And those who do, need to test high volumes to recoup the investment, which means that test times need to be short and smaller volume customer requirements cannot be served.
However, there are errors in DRAM technology that only arise in longer run times, like for example variable retention time induced fails or signal integrity issues. Testing for several hours or even days can eliminate the risk of costly recalls of failing memories once they are widely deployed.
The Rhinoe tester, shown at Embedded World (EW2023) last week, takes the sturdiness of rugged industrial applications and is significantly smaller than any other test equipment in the market, taking up only a quarter of a square meter, taking less than 100 times less energy to operate it.
“We don’t test in the conventional sense,” said Peter Pöchmüller, CEO of Neumonda and Neumonda Technology.
“We put memory ICs through their paces in real life conditions. We simulate the application and are able to predict much more accurately how well a memory will do in that target system. We look at the tested component from a customer application point of view. No one else can do that today, that’s unique. We also do not require any wafer supplier-related IP or proprietary test modes,” he said.
Neumonda Technology will use the tester to develop new DRAM memories that are qualified for the most demanding requirements, and also for smaller volume customers. In a next step, Neumonda Technology will expand the board to test Low Power DRAMs and flash memories.
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