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GaN-on-SiC transistor evaluation kits help verify performance in RF systems

GaN-on-SiC transistor evaluation kits help verify performance in RF systems

New Products |
By Wisse Hettinga



Each kit is customized to include a designer’s transistor model of choice (partially or fully-matched options are available) and includes a test fixture with one transistor fully mounted and tested, and a second spare device. Full RF test results, as tested under key conditions by the Integra technical support team, are also provided as a reference guideline.

Further an Application Note “Handling and Adjustment of Integra Technologies GaN-on-SiC HEMT Evaluation Kits” is available. In this application note, Integra recommends comparing your measured data with their RF data for the serial number installed in the test fixture and reconciling any discrepancies before removing or changing the transistor.

These kits can be borrowed free for 30 days or be purchased to own.

www.integratech.com

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