Gang test module kit supports parallel test and programming for up to 32 different assemblies
The kit consists of three interconnected module types – a TAP transceiver, a multipurpose parallel I/O unit, and a power management unit. It offers a complete solution for parallel applications based on Embedded System Access (ESA) technologies providing throughput increase by factors of 16 or 32. As only one system controller is required, efficiency increases and investment costs are reduced. The module kit, particularly developed for gang applications, can be flexibly adjusted to various environments and different test and programming applications such as Flash programming, MCU programming or dynamic tests per Processor Emulation.
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