Gang tester for up to 16 electronic assemblies in parallel

Gang tester for up to 16 electronic assemblies in parallel

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By eeNews Europe

The compact solution with integrated system power supply helps increase the throughput for UUT (unit under test) with a single TAP (test access port) by factor 16, which results in significantly improved production efficiency and reduced investment costs. Thanks to the TAP interfaces’ programmability (voltage, delay, protocol, etc.) and the TAP-to-UUT assignments’ individual configurability, the system can be flexibly customized to fit nearly any environment and application. 

The detection of latent defects in particular in HASS/HALT procedures becomes more and more important for many test and production scenarios. Available as rack mount version in 19’’ technology (1U), the SFX-TAP16/G-RM’s architecture supports all modern Embedded System Access (ESA) technologies, including boundary scan, processor emulation, and chip-embedded instrumentation, enabling the basic paradigm change for test and programming methods without mechanical probe access (non-intrusive). This new SCANFLEX module was developed specifically for Gang applications, whereby various test and programming strategies can be freely combined. The new transceiver can be flexibly adapted to the UUT characteristics; its bandwidth reaches from concurrent test/programming of 16 UUTs with a single TAP to two UUT with eight TAP each. In addition, the TAPs can be individually programmed in many parameters.

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