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GSA revitalizes Test Interest Group

GSA revitalizes Test Interest Group

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By eeNews Europe



The Global Semiconductor Alliance has appointed Dan Hamling, Sr. Director, IC Test and Assembly Business Development, GE Global Electronics Services, to serve as the GSA Test Interest Group chairman.

Hamling’s first action as chairman will be to establish a new mission, objectives and initiatives for the Test Interest Group.

Hamling has industry expertise, has established credibility and has immeasurably contributed to GSA’s past test-related efforts, according to the GSA.

"I am looking forward to working alongside [other] experts to produce meaningful results for the industry as we explore tough topics such as 3-D IC test flows and test capacity management," said Hamling, in a statement.

Prior to his current position at GES, Hamling was founder and CEO of Chip Nexus, a provider of test capacity management software solutions. Before that, Mr. Hamling spent 12 years in sales and marketing at Teradyne, following eight years in test engineering and test engineering management roles at various semiconductor companies.

Hamling has a B.S.E.E. from the University of Michigan, an M.S.E.E. from Stanford University and an MBA from the University of Texas.

"Dan’s experience and vast knowledge will make a great impact on our membership and the industry as a whole through the initiatives he will lead within the Test Interest Group."commented Jodi Shelton, President of GSA.

The first Test Interest Group meeting will be held on June 30 at 9:00am Pacific Time. GSA members and non-members in the semiconductor test arena are encouraged to join this meeting and voice their opinion on what major challenges should be addressed by the group. Contact Chelsea Boone, Director of Research, GSA.

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