I/O module enhances testability of assemblies
The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and a digitizer. With a total of 96 single ended channels the Boundary Scan test can be extended to non-scannable components such as connectors, clusters or analog interfaces. To increase flexibility, each channel can be configured as input, output and tri-state and can be easily programmed using many available parameters. These include switchable pull up/pull down or selectable slope steepness for the driver.
The SFX-5296LX uses the parallel I/O bus and therefore enables much faster data transfer than with serial, via TAP driven I/O modules. Based on the test resources available per channel, both static and dynamic at-speed tests are feasible, allowing a significant improvement of the structural fault coverage along with more flexible test strategies. Thereby only one SFX slot is needed. To increase the number of channels, several modules can be operated simultaneously.
The module is based on the ASIC CION-LX, a multifunctional mixed signal tester on chip (ToC) developed by GOEPEL electronics.
Visit GOEPEL electronics at www.goepel.com
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