IC temperature bench testing

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By eeNews Europe

The thermal probe is designed with interchangeable thermal heads to mate directly to an IC or other device under test creating a highly efficient thermally conductive path to quickly induce temperatures to the device, even under power.

Interfacing to the DUT is available for in-circuit and test socket applications. Connecting the thermal head to the DUT is made easy and precise through a quick lock-down mechanism on the thermal head. Two models, DCP-1 and DCP-2, span a temperature range from -65 to 200ºC.

The DCP-1 provides cooling power of 25W at -40ºC for lower power devices, while the DCP-2 provides a capacity to cool 55W at -55ºC and 120W at -40ºC. A touch-screen controller permits user-programmable temperatures, graphing, data logging, and more. Using DUT control, with a thermocouple or diode, the system provides fast and precise transitions to temperature at the IC.

Visit inTEST Thermal Solutions at


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