In-line test system improves productivity

In-line test system improves productivity

New Products |
By eeNews Europe

The Rapido systems offer double-sided contact with up to 3000 pins over 32 sites to perform inline programming of non-volatile memories in Flash devices, microcontrollers and Programmable Logic Devices (PLDs). The system allows users to combine programming with test strategies such as Boundary Scan, Processor Emulation, Chip Embedded Instruments or function test. Significant improvements include the new features of the FID module (Fixture Identification and Data). The intelligent system informs users about service intervals and maintenance instructions for customer-specific adapters. In addition, the module can store information from past maintenance cycles to track an adapter’s history. As a result, pseudo-errors due to faulty contacts resulting from worn out needles can be avoided. The intelligent project management rules out operating errors through manual project change.

Another new function is Re-testing. It provides additional efficiency for programming and test procedures. Users now can pre-define a number of repeating cycles after unsuccessful programming or test runs. In addition, the RPS 900-S16/32 models are now available with extended usable test area with up to 450 x 250 mm.

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