Industrial image sensor combines high resolution, enhanced performance
The new sensor provides up to twice the imaging sensitivity of the existing KAI-29050 in the wavelength range of 500 nanometer (nm) to 1050 nm. This improved performance is particularly beneficial to applications operating in near-infrared (NIR) wavelengths (around 850 nm). The enhanced pixel design retains isolation of charge from one photodiode to another, enabling this increase in sensitivity without reducing image sharpness (Modulation Transfer Function, or MTF). In addition, an improved amplifier design reduces read noise by 15%, increasing the linear dynamic range available from the device to 66 decibel (dB). With these enhancements, the KAI-29052 serves as a new performance benchmark for high resolution image capture.
The sensor serves the evolving needs of industrial imaging applications such as security, machine vision, and aerial surveillance and mapping, said Herb Erhardt, Vice President and GM, Image Sensor Group at ON Semiconductor.
The KAI-29052 is available in a RoHS-compliant CPGA-72 package in Monochrome, Bayer Color, and Sparse Color configurations, and is pin compatible not only with the existing KAI-29050 image sensor but also a full family of 5.5 micron and 7.4 micron CCD image sensors, enabling camera manufacturers to adopt the new device.
Evaluation kits for the CCD image sensor are available, allowing the performance of devices such as the KAI-29052 to be examined and reviewed under real-world conditions.
For more information, visit https://www.onsemi.com.
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