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Innovative interface supports high volume HF semiconductor testing

Innovative interface supports high volume HF semiconductor testing

New Products |
By eeNews Europe



The Multitest mmWave Contactor claims to offer field proven outstanding electrical performance while maintaining best mechanical characteristics.

Multitest has developed an innovative hybrid contacting solution that combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. By combining spring probe and cantilever technologies Multitest has extended the reach of volume production contactors to the  high frequencies ranges needed by automotive radar, WiGig, and 5G backhaul devices.

Keeping the interface from test equipment to the device as short as possible while minimizing the number of transitions is how Multitest is able to minimize the loss and maintain broadband performance from DC to 81 GHz (<-10 dB return loss and 4 dB to 6 dB insertion loss typical at 81GHz).

The mmWave contactor addresses the mechanical requirements of high volume production by incorporating high compliance, robust spring probes and materials and onsite replacement compatibility. The contactor assembly can be fully serviced onsite without incurring delays due to shipping lead times or RMA queues. The entire contacting solution is mechanically assembled and each component can be removed and replaced on site.

The mmWave contactor solution has overcome the challenge of using of metal transmission lines for extremely high frequency applications.

www.multitest.com/mmWave

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