These capabilities allow engineers to measure the increasingly fast digital signals used in emerging technologies and validate and troubleshoot their designs with confidence.
The U4154A AXIe-based logic analyzer module and associated probes and powerful analysis software provide essential capabilities for engineers working with DDR (double data rate) memory systems, high-speed application-specific integrated chips, analog-to-digital converters and field-programmable gate arrays operating at speeds up to 4 Gb/s.
Timing zoom provides simultaneous state and timing measurements with 80 ps timing resolution and 256 K-sample memory depth, which gives designers more insight into problems by allowing simultaneous state and high-resolution timing measurements over a 20-µs time span. The industry’s highest trigger sequencer speed (2.5 Gb/s) gives engineers the ability to trigger reliably on sequential events on DDR memory and other high-speed signals without having to give up triggering flexibility.
“The need for reliable measurements and deep analysis has reached a critical juncture as engineers who focus on high-performance servers and embedded systems begin work on DDR3 2133 systems,” said Perry Keller, Agilent’s representative on the JEDEC DDR committee. “These capabilities will become more critical in the near future as DDR memory speeds continue to increase. The U4154A logic analyzer is the ideal tool for DDR memory measurement and debug work.”
At high speeds, signal integrity validation becomes critical for reliable performance. Validating signal integrity on all channels of a DDR system with an oscilloscope can be very time consuming. The exclusive eye-scan capability of the U4154A allows a quick overview of signal integrity on all signals of a DDR system in a fraction of the time it takes using alternative methods.
The U4154A logic analyzer module is compatible with the company’s M9502A two-slot AXIe chassis. Multiple modules can be combined on a single time base and trigger sequencer. Multiple modular systems, including Agilent 16900 series frames, can be combined for time-correlated measurements on multiple buses in a system.
For further information: www.agilent.com.