The researchers developed a technique for making ultrafast measurements using atomic force microscopy, which previously could only investigate slow or static material structures and functions. In AFM, a rastering probe maps a material’s surface and captures physical and chemical properties but the probe is slow to respond to what it detects. Instead, the ORNL fast free force recovery technique uses advanced machine learning algorithms to analyse instantaneous tip motion to produce high-resolution images 3,500 times faster than standard AFM detection methods.
“This new approach can probe fast processes, such as charge screening, ionic transport and electrochemical phenomena, which were previously inaccessible with traditional AFM,” said Liam Collins at ORNL. The technique has been used to map the surface voltage dynamics from ion migration induced by an electric field in a perovskite solar cell (shown above).
The technical storage or access is strictly necessary for the legitimate purpose of enabling the use of a specific service explicitly requested by the subscriber or user, or for the sole purpose of carrying out the transmission of a communication over an electronic communications network.
The technical storage or access is necessary for the legitimate purpose of storing preferences that are not requested by the subscriber or user.
The technical storage or access that is used exclusively for statistical purposes.The technical storage or access that is used exclusively for anonymous statistical purposes. Without a subpoena, voluntary compliance on the part of your Internet Service Provider, or additional records from a third party, information stored or retrieved for this purpose alone cannot usually be used to identify you.
The technical storage or access is required to create user profiles to send advertising, or to track the user on a website or across several websites for similar marketing purposes.