MEMS measure contact force in connectors
Connectors used in the electronics industry typically have a size in the sub-millimeter range and feature multiple contact points. Measuring the individual contact force is essential for the quality management: The contact force is a key parameter for the electric behavior and the performance of the connector throughout its lifecycle. Determining the value of this parameter is a central building block for the qualification process and for the quality assurance in the production.
Due to the further miniaturization common steel based methods becomes unsuitable to perform an adequate measurement in sub-millimeter spatial dimensions. The new approach of a silicon based sensor tab allows the precise measurement of the contact normal force in sub-millimeter connectors and to close the existing gap in the quality management.
The university will exhibit its sensors at the Hannover fair (April 25 through April 29), hall 2 stand 28.
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