MENU

MISIC picks Keysight modulation distortion system for device test

MISIC picks Keysight modulation distortion system for device test

Business news |
By Jean-Pierre Joosting



Keysight Technologies has announced that MISIC Microelectronics has selected the Keysight S930705B Modulation Distortion system to enable the fast and accurate active-device modulation distortion characterization of the company’s microwave devices and components. 

Demand for higher data throughput and lower latency is pushing device specifications and operational standards toward wideband modulation. However, wideband performance significantly increases noise, which introduces additional test complexity and measurement uncertainty for semiconductor makers such as MISIC.

By employing the Keysight S930705B modulation distortion software running on the N5245B PNA-X Microwave Network Analyzer, MISIC can make microwave device measurements with extremely low residual error vector magnitude (EVM) to get a complete picture of the device’s performance without test system interference. This is because the S930705B provides nonlinear device under test (DUT) behaviors such as EVM, noise power ratio (NPR), and adjacent channel power ratio (ACPR) under modulated stimulus conditions. As a result, MISIC can achieve excellent signal fidelity and accurate modulated measurements at 5G, 6G, microwave, and millimeter wave frequencies.

Debin Hou, General Manager, MISIC Microelectronics, said: “Keysight gives us a cost-effective test solution that provides us with highly accurate measurements by eliminating system noise and interference. The single test setup allows complete characterization of an amplifier that would have taken two separate test stations or the use of a complex and expensive switching matrix.”

Peng Cao, Vice President and General Manager of Keysight’s Wireless Test group, said: “Thanks to Keysight’s modulation distortion system, MISIC has the right mix of speed and measurement integrity to gain a deeper understanding of its designs and accelerate its research and development workflow. As an integrated product, it eliminates the need for an entire rack of test of equipment and reduces the cost of device development and validation.”

www.keysight.com

 

Related articles

S-band 120 kW pulse transmitter for radar and test
Tool for UWB PHY layer validation/conformance test
One box 5G FR1 characterization and production test 
Testbed as a service for RAN Intelligent Controller testing
Anokiwave and MilliBox collaborate on mmWave OTA test

If you enjoyed this article, you will like the following ones: don't miss them by subscribing to :    eeNews on Google News

Share:

Linked Articles
10s