Multitest ships first shaker for MT9928 chip tester
The MT9928 has a kitable and modular architecture and therefore can be converted to different package types and configured with various loading and unloading options. The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and meets the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes.
The new 45° high g sensor test solution continues this approach. The 45° high g sensor is dedicated for X/Y stimulation of the MEMS devices and allows for two axis testing in one single stimulation. This way one stimulation cycle time can be saved and the packages need to be touched less often, which reduces the risk of damages during test. If testing has to be done at various temperature levels this advantage multiplies.
The new 45° high g module for the MT9928 gravity handler combines test time and test process optimization with more flexibility and better equipment utilization. The customer for this premiere shipment is “a major international IDM” the company said, declining to elaborate.
More information: www.multitest.com/sensor
If you enjoyed this article, you will like the following ones: don't miss them by subscribing to :
