New instrument is optimized for high power semiconductor test

New instrument is optimized for high power semiconductor test

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By eeNews Europe

The Model 2651A provides the widest current range available in the industry. The range is critical for a variety of R&D, reliability, and production test applications, such as testing high brightness LEDs (HBLEDs), power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.

Like each member of the Series 2600A family, the Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It combines the functionality of multiple instruments in a single full-rack enclosure: semiconductor characterization instrument, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load, and trigger controller, and is fully expandable into a multi-channel, tightly synchronized system via Keithley’s TSP-Link technology.

Unlike competitive solutions, which typically have limited power, measurement speed, and/or resolution, the Model 2651A can source or sink up to 2,000 W of pulsed power (±40 V, ±50 A) or 200 W of DC power (±10 V@±20 A, ±20 V@±10 A, ±40 V@±5 A). It can also make precise measurements of signals as low as 1 pA and 100 microvolts at speeds up to one microsecond per reading.

The Model 2651A provides a choice of digitizing or integrating measurement modes for precise characterization of both transient and steady-state behavior. Two independent analog-to-digital (A/D) converters define each mode – one for current and the other for voltage – which run simultaneously for accurate source readback without sacrificing test throughput.

The digitizing measurement mode’s 18-bit A/D converters allow capturing up to one million readings per second for continuous one-microsecond-per-point sampling, making this mode the most appropriate choice for waveform capture and measuring transient characteristics with high precision. Competing solutions must average multiple readings to produce a measurement result and often don’t allow the measurement of transient behavior.

The integrating measurement mode, based on 22-bit A/D converters, optimizes the instrument’s operation for applications that demand the highest possible measurement accuracy and resolution. This ensures precise measurements of the very low currents and voltages common in next-generation devices. All Series 2600A instruments provide integrating measurement mode operation.

Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50 A to 100 A. This is two-and-one-half to five times greater than the nearest competing solution. The voltage range can be expanded from 40 V to 80 V when two units are connected in series. The embedded Test Script Processor (TSP) included in all Series 2600 A instruments simplifies testing by allowing users to address multiple units as a single instrument so that they act in concert. The built-in trigger controller in the Model 2651A can synchronize the operation of all linked channels to within 500 nanoseconds. These capabilities of the Model 2651A provide the broadest dynamic range available in the industry, making the unit suitable for a broad variety of high current, high power test applications, including:

  • Power semiconductor, HBLED, and optical device characterization and testing
  • Characterization of GaN, SiC, and other compound materials and devices
  •  Semiconductor junction temperature characterization
  •  Reliability testing
  •  High speed, high precision digitization
  •  Electromigration studies


The Model 2651A will be available in April 2011.

To view an online product tour on the Model 2651A, visit

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