NXP adds EIS to EV battery management
NXP Semiconductors has released a battery management chipset that integrates electrochemical impedance spectroscopy (EIS) directly into its hardware. The technology enables synchronized cell diagnostics across the pack, potentially improving safety, charging control, and long-term performance in electric vehicles and stationary storage systems.
For eeNews Europe readers, this is relevant as EIS-based monitoring is becoming an area of active development among European carmakers and Tier-1 suppliers seeking predictive battery health analytics and faster certification for high-voltage systems.
Integrating impedance analysis into the BMS
The chipset combines three devices — the BMA7418 cell sensor, the BMA6402 gateway, and the BMA8420 battery junction box controller — all designed for nanosecond-level synchronization. Together, they perform real-time impedance measurements without external instrumentation.
An on-chip signal generator pre-charges the high-voltage circuit and applies an excitation signal that allows DC link capacitors to act as a secondary energy reservoir. According to NXP, this arrangement can capture frequency-domain responses linked to temperature, ageing, and micro short circuits, potentially reducing the need for additional sensors while simplifying pack design.
Availability
NXP expects the EIS-capable chipset to become available in early 2026, with enablement software running on its S32K358 automotive microcontroller. The release expands the company’s electrification portfolio, which already includes cell controllers, gateways, and battery junction box controllers for high-voltage EV architectures.
“The EIS solution brings a powerful lab-grade diagnostic tool into the vehicle. It simplifies system design by reducing the need for additional temperature sensors and supports the shift toward faster, safer and more reliable charging without compromising battery health. The chipset also offers a low-barrier upgrade path, with pin-to-pin compatible packages that can be directly upgraded to on-cell module and battery junction box control units,” said Naomi Smit, VP and GM, Drivers and Energy System, NXP Semiconductors.
Impact on EV diagnostics
By embedding EIS functionality within production-grade BMS silicon, NXP aims to make impedance-based cell health assessment practical for series vehicles. If validated in European programs, the approach could offer carmakers a more consistent method to predict battery degradation, support warranty analysis, and enhance safety monitoring during fast-charging cycles.
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