On-chip process, voltage and temperature sensing controller IP ready for 28nm
On-chip PVT monitoring is now a key consideration for 28-nanometer (nm) and FinFET technology based designs. Higher accuracy monitors embedded within SoC designs enable a greater opportunity for dynamic performance optimisation, either for lower power or higher data throughput as well as offering greater device reliability.
Sensing die temperature, detecting logic speed and monitoring voltage supply levels can be used intelligently to vary system clock frequencies and the voltage levels of supply domains. A benefit of embedded thermal monitoring in particular is to enhance device reliability and life-time by assessing the electro-migration effects of hot spots within the chip.
A key aspect is that PVT data collection can be applied to each and every device, either during production or ‘in-the-field’. Moortec believe that strategies adopted by IC designers over the coming years will be heavily influenced by the analysis of data harvested from in-chip monitors.
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