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New CEO for power module maker Vincotech
New CEO for power module maker Vincotech
Business news | - By Nick Flaherty
Eckart Seitter is set to take over as CEO of power module maker Vincotech in October when the current CEO…
1350V IGBT for resonance power in domestic appliances
1350V IGBT for resonance power in domestic appliances
New Products | - By Nick Flaherty
Toshiba's GT20N135SRA 1350V IGBT can reduce the size of heatsinks for resonance power in domestic appliances such as microwave ovens…
Breakthrough for ultra-fast magnetic testing of STT-MRAM devices above 2 Tesla
Breakthrough for ultra-fast magnetic testing of STT-MRAM devices above 2 Tesla
Technology News | - By Nick Flaherty
French startup Hprobe is demonstrating a magnetic generator that can test Magnetic Tunnel Junction (MTJ) for Spin Transfer Torque (STT) Magnetic Random Access Memory (MRAM) devices…
€74m next generation silicon IGBT project starts
€74m next generation silicon IGBT project starts
Technology News | - By Nick Flaherty
A European project to develop the next generation of silicon power devices has started, aiming for IGBTs that operate over…
System-level tester for high speed mobile memories
System-level tester for high speed mobile memories
New Products | - By Nick Flaherty
Advantest has launched a memory tester for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe…
Advantest adds module and system test with Astronics business buy
Advantest adds module and system test with Astronics business buy
Business news | - By Christoph Hammerschmidt
Advantest is to buy the commercial Semiconductor System Level Test business from US aerospace supplier Astronics for $185m, plus an…
Advantest adds module and system test with Astronics business buy
Advantest adds module and system test with Astronics business buy
Business news | - By Nick Flaherty
Advantest is to buy the commercial Semiconductor System Level Test business from US aerospace supplier Astronics for $185m, plus an…
Parametric test boost for next-generation 3nm chips
Parametric test boost for next-generation 3nm chips
New Products | - By Nick Flaherty
Advantest has added parametric testing for chip process-characterisation and monitoring needs for 3nm process nodes and beyond.
Smart fuse reduces cost, weight of automotive wiring harness
Smart fuse reduces cost, weight of automotive wiring harness
Technology News | - By Christoph Hammerschmidt
The steady growth in the number of electronic, electrical and electro-mechanical functions in cars has given rise to many innovations…
Smart fuse reduces cost, weight of automotive wiring harness
Smart fuse reduces cost, weight of automotive wiring harness
Technology News | - By Christoph Hammerschmidt
The steady growth in the number of electronic, electrical and electro-mechanical functions in cars has given rise to many innovations…


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