Parametric Measurement Module doubles speed in SoC testing
According to the vendor, measurement using the T2000 PMU32E is more than two times faster than with its predecessor. In particular, DC linearity measurement time is faster due to an enhanced sampling rate and enhanced data transfer. These faster operating speeds lead to significantly higher throughputs and a lower overall cost of test while maintaining backwards compatibility, Advantest says.
Operating efficiency is further improved by the new module’s ability to run test programs already developed for the earlier PMU32 module. In addition, the new module has twice as much memory capacity, expanding the capabilities of the channel-independent arbitrary waveform generator (AWG) and digitizer.
The PMU32E also supports load testing of on-die regulators (ODR) with its ISVM (current source and voltage measurement) ganging function.
Advantest expects to begin shipping PMU32E modules to customers by the first quarter of 2015.
Further information: www.advantest.de
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