PXI RF power amplifier test accelerates throughput ten fold

PXI RF power amplifier test accelerates throughput ten fold

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By eeNews Europe

The NI PXI set-up for power amplifier test integrates a variety of mixed-signal, high-performance instruments to meet the demanding requirements for fast and precise PA test in validation and production environments. The demonstration featured the latest NI PXI instruments including the PXIe-5665 14 GHz vector signal analyser, the PXIe-6556 digital per pin parametric measurement unit (PPMU), the PXIe-4154 battery simulator and the PXIe-5186 12.5 GS/s, 5 GHz digitiser. With these PXI-based modular instruments, engineers can perform a wide variety of PA tests and measurements such as power versus time (PVT), error vector magnitude (EVM), adjacent channel leakage ratio (ACLR), current leakage, harmonics and open-shorts tests.

The PXI set-up for power amplifier test joins an expansive selection of NI PXI tools, which currently includes more than 450 different PXI modules to address virtually any engineering challenge. It builds on this success and on the technical advantages of the PXI platform, including advanced timing and synchronisation capabilities, which make it possible for engineers to share triggers and clocks between instruments. Such features, combined with the high-speed PXI Express bus, result in test speeds that are up to 10 times faster than traditional box solutions. National Instruments also provides software to address the wide variety of RF standards including LTE, GSM/EDGE , WCDMA, WLAN, WiMAX, ZigBee and Bluetooth.

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