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Reference design for first 28nm short range automotive radar

Reference design for first 28nm short range automotive radar

Business news |
By Nick Flaherty

Cette publication existe aussi en Français


A radar target simulator from Rohde & Schwarz has been used to verify the performance of a next-generation short range radar sensor reference design from NXP Semiconductor.

Engineers from Rohde & Schwarz and NXP conducted a comprehensive series of tests to verify the new sensor reference design using the NXP SAF85xx 28 nm RFCMOS radar one-chip SoC.

The R&S RTS radar test system combines the R&S AREG800A automotive radar echo generator with the R&S QAT100 antenna mmW frontend, offering short-distance object simulation capabilities. This enables realistic tests of next generation automotive radar applications and brings automotive industry’s vision of fully autonomous driving one step closer.

The SAF85xx is the industry’s first 28 nm RFCMOS radar one-chip SoC family and the reference design can be used for short, medium and long-range radar applications to serve challenging NCAP (NCAP: New Car Assessment Program) safety requirements as well as highway pilot or urban pilot for the fast-growing segment of L2+ and L3 vehicles.

NXP radar SoC enables 360-degree surround sensing

R&S says the RTS is the only test system suitable for complete characterization of radar sensors and radar echo generation with object distances down to the airgap value of the radar under test. It combines the R&S AREG800A automotive radar echo generator as a backend and the R&S QAT100 antenna array or the R&S AREG8-81S as a frontend for the whole automotive radar lifecycle including development lab, hardware-in-the-loop (HIL), vehicle-in-the-loop (VIL), validation and production application requirements. The system is also fully scalable and can emulate the most complex traffic scenarios for advanced driver assistance systems.

“We have been collaborating closely and successfully with Rohde & Schwarz for many years on the verification of our automotive radar sensor reference designs. Rohde & Schwarz’ cutting-edge automotive radar test systems allows us high-quality and highly efficient validation of our automotive radar products and proves outstanding performance of our radar one-chip. The level of experience, quality and support that Rohde & Schwarz provides to NXP is making a difference,” said Adi Baumann, Senior Director ADAS R&D, at NXP Semiconductors.

NXP backs Zendar for 4D radar

NXP will present the latest developments for radar including the automotive radar sensor reference design at CES 2024 trade show in Las Vegas from January 9 to 12, 2024.

NXP has chosen the R&S RTS radar test system to verify their radar sensor reference design based on the industry’s first 28 nm RFCMOS one-chip radar SoC.

www.rohde-schwarz.com 

 

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