Rohde & Schwarz at EuMW 2016: Highest frequency test take center stage

Rohde & Schwarz at EuMW 2016: Highest frequency test take center stage

Business news |
By Christoph Hammerschmidt

The company’s extensive portfolio for radar test applications covers test requirements both at the component and the system level. For characterizing active modules such as transmit/receive modules (T/R modules), Rohde & Schwarz will present a test solution consisting of its ZVA network analyzer up to 67 GHz and the ZVAX TRM extension unit. The latter provides signal conditioning for demanding measurements on active components. The FSWP phase noise analyzer and VCO tester offers extremely high sensitivity and measurement speed even for phase noise tests on pulsed sources.

For developers and manufacturers of radar systems, Rohde & Schwarz will present an innovative solution for radar echo simulation based on the SMW200A vector signal generator. This system can even simulate moving objects, Doppler frequencies and radar cross sections, enabling users to significantly reduce the need for expensive and cumbersome field tests.

Also on display will be test systems for generating and analyzing extremely wideband pulsed signals with the SMW200A vector signal generator with suitable pulse sequencer software as well as the FSW85 signal and spectrum analyzer with a bandwidth of up to 2 GHz in the frequency range up to 85 GHz. Rohde & Schwarz will also be demonstrating how an RTO2000 digital oscilloscope can be used in combination with the VSE vector signal explorer software for performing desktop pulse analysis.


Satellite test

For users in the satellite communications sector, Rohde & Schwarz will present its new NRP(N) generation of power sensors. These sensors are especially well-suited to power measurements on directional and satellite radio components thanks to their unique combination of USB and LAN interfaces on the same sensor. This makes it possible to bridge large distances between the DUT and the user.

A satellite link test system based on the SLG satellite load generator and the BTC broadcast test center will also be showcased. The SLG can generate up to 32 transponder signals or a single 500 MHz bandwidth transponder, enabling the efficient testing of components, satellite systems and receivers and the simulation of live video and data links in real time.


Automotive test

Users in the automotive sector will also benefit from the company’s expertise in the field of radar testing. The FSW85 signal and spectrum analyzer analyzes FMCW chirp signals up to 2 GHz bandwidth and covers the 24 GHz and 79 GHz frequency bands allocated to automotive radars with a single device and without any additional, external frequency converters. Also on display will be the ARTS9510 automotive radar target simulator, the TS7124 shielded RF test box and the NRP8S power sensor, which provide optimized measurement for production tests on automotive radar sensors.


5G test

Researchers around the globe are seeking concepts and technologies for fifth generation (5G) wireless networks, and Rohde & Schwarz is already supporting them with its test and measurement equipment. The setup to be showcased at EuMW, consisting of an SMW200A vector signal generator and an FSW85 signal and spectrum analyzer, offers the flexibility and T&M functionality required, for example, to test waveform candidates and new frequency bands for commercial wireless communications. Using the TS 5GCS channel sounding software, the two instruments can also characterize the new wireless channels in order to determine their optimal use.


Signal integrity test

The ZNBT20 from Rohde & Schwarz is the first true multiport network analyzer with up to 16 integrated test ports for operation up to 20 GHz. The high number of test ports makes it possible to perform signal integrity tests for transmission standards with high data rates, for example simultaneous tests on multicore wiring systems. In combination with the ZNBT-K20 option for extended time domain analysis, the ZNBT can display eye diagrams, rise time and skew.


Semiconductor test

Rohde & Schwarz has a close partnership with MPI Corporation for high-quality on-wafer test systems. Probe stations from MPI offer outstanding mechanical stability and innovative features for prober handling. In conjunction with the ZVA high-end network analyzer, highly reproducible results can be achieved.

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