Semiconductor temperature testing for automotive and industrial applications

Semiconductor temperature testing for automotive and industrial applications

By eeNews Europe

The new service is mainly for developers of automotive and industrial applications who wish to guarantee semiconductor and IC thermal behaviour and reliability at wider operating temperature ranges.

DELTA’s new testing includes a temperature handler that allows test cycles to run between extremely high (+175°C) and extremely low (-55°C) temperatures with full temperature control during tests. The Tri-Temp pick and place handler offers throughput up to 5,300 units per hour for device sizes from 2×2 to 70×70 mm.

The new handler extends DELTA’s European test facilities for testing analogue, digital, mixed signal and RF components. DELTA’s semiconductor test lab includes wafer probers, component handlers using ATE, qualification services and failure analysis lab.

More information

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