MENU

Sub-nanovolt testing for small-signal discretes

Sub-nanovolt testing for small-signal discretes

New Products |
By Nick Flaherty



This allows individual screening of small-signal discrete components to levels below a billionth of a volt (nV/√Hz) of noise in quantities up to tens of thousands of parts. The system was developed as part of a US defence programme developing small signal devices, and the company is now providing ultra-low-noise-screened parts to other customers.

“Small-signal discrete components can help create the lowest noise signal chains possible and that’s what our customers have been demanding,” said Timothy McCune, president of Linear Systems. “This sub-nanovolt testing capability enables us to provide production-line quantities of parts guaranteed to meet specific noise levels. No other company has this capability.” The Fremont, CA-based company was founded by John H. Hall, co-founder of Intersil and founder of Micro Power Systems.

Linear Systems specialises in the development and manufacture of precision, ultra-low-noise small-signal discrete components. Its parts, such as the LSK389 and LSK489, are used in sensor systems ranging from the Large-Scale Synoptic Telescope to piezoelectric devices to sonobuoys. These parts also provide the front-end amplification for high-end test and measurement, medical and audio equipment.

www.linearsystems.com

If you enjoyed this article, you will like the following ones: don't miss them by subscribing to :    eeNews on Google News

Share:

Linked Articles
10s