System speeds tests of analog, mixed-signal and sensor chips
With the system, Advantest particularly targets testing of low pin count ICs. The description ‘low pin count’ refers to DC/DC converters, voltage regulator ICs as well as A/D and D/A converter chips. In terms of test scenarios, the system allows users to conduct characterisation, functional evaluation and mass production tests.
Instead of writing thousands of lines of C-code or complex templates, the EVA100 offers the possibility to set up test scenarios in a drag-and-drop manner, which significantly reduces lead times and frees up test engineers tome to focus on the actual test process. Designed for both engineering and volume production, the system enables simultaneous control of multiple test functions to achieve highly precise measurements and improve testing efficiency. By integrating analog-voltage and current-source measurements, an eight-channel, 100-Mbps pattern generator and an oscilloscope in one compact system, the EVA100 also eliminates the need for complicated cabling to connect and coordinate the various instruments.
With respect to the two application environments targeted (engineering and volume production), the EVA 100 is available in two models. The E model is implemented in a shoebox-like casing and addresses engineering purposes. It comes with eight slots for instrumentation cards. Available are analog, digital, mixed-signal and power modules. The P model is designed to meet the requirements of high-volume ramps. Up to four systems can be put together to increase parallelism and lower cost of testing.
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