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Test adapter addresses SMARC computer-on-modules

Test adapter addresses SMARC computer-on-modules

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By eeNews Europe



Using spring probe pins, the adapter supports very high contact cycles. It is volume test ready and reduces the cost per tested module. Operation is easy and secure. This test adapter within Yamaichi Electronics ́ YED900 test adapter series can be used for the evaluation of bench tests and for reliability testing from -50°C up to +150°C.
The socket is designed with compression mount technology (CMT), requiring no soldering and making it “plug and play”. For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. Kelvin type pins are also available.

Visit Yamaichi Electronics at www.yamaichi.eu

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