Test card evaluates mobile device behaviour in extreme temperatures
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By
eeNews Europe
M2M UICCs are perfect for devices that must perform in rough environments and meet extended lifetime expectations. The 64K/J LTE Test (U)SIM – M2M UICC examines mobile device behaviour at temperatures between -40 to +105°C, instead of the previously-required -25 to +85°C. Thus, the card meets the ETSI specification TS 102 671. Additionally, the M2M Test (U)SIM includes new LTE data fields and carries a GSM and a USIM application. The card supports 1.8V, 3V and 5V voltage classes and is available in the Plug-In/2FF format.
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